Tulipe, D. C. La: search on Z-Library

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1

Three-dimensional integrated circuits

Topol, A. W., Tulipe, D. C. La, Shi, L., Frank, D. J., Bernstein, K., Steen, S. E., Kumar, A., Singco, G. U., Young, A. M., Guarini, K. W., Ieong, M.

Journal:

IBM Journal of Research and Development

Year:

2006

Language:

english

File:

PDF, 790 KB

english, 2006

2

[IEEE 2012 3rd IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) - Tokyo, Japan (2012.05.22-2012.05.23)] 2012 3rd IEEE International Workshop on Low Temperature Bonding for 3D Integration - Wafer-scale oxide fusion bonding and wafer thinning development for 3D systems integration: Oxide fusion wafer bonding and wafer thinning development for TSV-last integration

Skordas, S., Tulipe, D. C. La, Winstel, K., Vo, T. A., Priyadarshini, D., Upham, A., Song, D., Hubbard, A., Johnson, R., Cauffman, K., Kanakasabapathy, S., Lin, W., Knupp, S., Malley, M., Farooq, M. G

Year:

2012

File:

PDF, 787 KB

2012

3

Wafer-level 3D integration technology

Koester, S. J., Young, A. M., Yu, R. R., Purushothaman, S., Chen, K.-N., La Tulipe, D. C., Rana, N., Shi, L., Wordeman, M. R., Sprogis, E. J.

Journal:

IBM Journal of Research and Development

Year:

2008

Language:

english

File:

PDF, 420 KB

english, 2008

4

Positive mode silylation process characterization

D.C. La Tulipe, A.T.S. Pomerene, J.P. Simons, D.E. Seeger

Journal:

Microelectronic Engineering

Year:

1992

Language:

english

File:

PDF, 325 KB

english, 1992

5

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Enabling SOI-based assembly technology for three-dimensional (3d) integrated circuits (ICs)

Topol, A.W., La Tulipe, D.C., Shi, L., Alam, S.M., Frank, D.J., Steen, S.E., Vichiconti, J., Posillico, D., Cobb, M., Medd, S., Patel, J., Goma, S., DiMilia, D., Robson, M.T., Duch, E., Farinelli, M.,

Year:

2005

Language:

english

File:

PDF, 1.18 MB

english, 2005

6

[IEEE Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits - Ithaca, NY, USA (7-9 Aug. 1989)] Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits - S-parameter characterization of GaAs gate SISFETs at liquid nitrogen temperatures

Kwark, Y., Solomon, P., La Tulipe, D.

Year:

1989

Language:

english

File:

PDF, 469 KB

english, 1989

7

IIA-2 saturable charge FET

Solomon, P.M., Frank, D.J., Baratte, H., La Tulipe, D., Wright, S.L.

Journal:

IEEE Transactions on Electron Devices

Year:

1987

Language:

english

File:

PDF, 163 KB

english, 1987

8

Reactive Ion Etching of GaSb, (Ai,Ga)Sb, and InAs for Novel Device Applications.

La Tulipe, D.C., Frank, D.J., Munekata, H.

Journal:

MRS Proceedings

Year:

1990

Language:

english

File:

PDF, 3.76 MB

english, 1990

9

Probe pressure effect on tunneling current through a GaAs-(Al,Ga)As-GaAs heterojunction barrier

Solomon, P. M., Wright, S. L., La Tulipe, D.

Journal:

Applied Physics Letters

Year:

1986

Language:

english

File:

PDF, 429 KB

english, 1986

10

New phenomena in coupled transport between 2D and 3D electron-gas layers

Solomon, P., Price, P., Frank, D., La Tulipe, D.

Journal:

Physical Review Letters

Year:

1989

Language:

english

File:

PDF, 677 KB

english, 1989

11

Novel InAs/(Al,Ga)Sb FET with direct gate-to-channel contact

Frank, D.J., La Tulipe, D.C., Munekata, H.

Journal:

IEEE Electron Device Letters

Year:

1991

Language:

english

File:

PDF, 285 KB

english, 1991

12

Thin-film imaging: Past, present, prognosis

Seeger, D. E., La Tulipe, D. C., Kunz, R. R., Garza, C. M., Hanratty, M. A.

Journal:

IBM Journal of Research and Development

Year:

1997

Language:

english

File:

PDF, 1.43 MB

english, 1997

13

Thermally stable ohmic contacts to n-type GaAs. VIII. Sputter-deposited InAs contacts

Kim, H.-J., Murakami, Masanori, Wright, S. L., Norcott, M., Price, W. H., La Tulipe, D.

Journal:

Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 1.10 MB

english, 1990

14

[IEEE Sixth International Conference Metalorganic Vapor Phase Epitaxy - Cambridge, MA (June 8-11, 1992)] Sixth International Conference Metalorganic Vapor Phase Epitaxy - Improved Schottky Gate Characteristics for MOVPE-Grown GaAs MESFETs

Tischler, M.A., La Tulipe, D.C., Kuech, T.F., Magerlein, J.H., Hovel, H.J.

Year:

1992

Language:

english

File:

PDF, 146 KB

english, 1992

15

Depletion-mode GaAs SISFET's by selective ion implantation

Baratte, H., Solomon, P.M., La Tulipe, D.C., Jackson, T.N., Frank, D.J., Wright, S.L.

Journal:

IEEE Electron Device Letters

Year:

1987

Language:

english

File:

PDF, 351 KB

english, 1987

16

[IEEE 2008 IEEE International SOI Conference - New Paltz, NY (2008.10.6-2008.10.9)] 2008 IEEE International SOI Conference - Upside-down FETS

La Tulipe, D. C., Frnak, D. J., Steen, S.E., Topol, A.W., Patel, J., Ramakrishnan, L., Sleight, J.W.

Year:

2008

Language:

english

File:

PDF, 99 KB

english, 2008

17

[IEEE IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. . - Ithaca, NY (August 10-12, 1987)] IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, 1987. Proceedings. - Enhance / Deplete GaAs SISFETs

Baratte, H., La Tulipe, D.C., Frank, D.J., Solomon, P.M., Jackson, T.N., Wright, S.L.

Year:

1987

Language:

english

File:

PDF, 493 KB

english, 1987

18

[IRE 1986 International Electron Devices Meeting - ()] 1986 International Electron Devices Meeting - Self-aligned processes for the GaAs gate FET

Baratte, H., La Tulipe, D.C., Knoedler, C.M., Jackson, T.N., Frank, D.J., Solomon, P.M., Wright, S.L.

Year:

1986

Language:

english

File:

PDF, 341 KB

english, 1986

19

Process optimization for high electron mobility in nMOSFETs with aggressively scaled HfO/sub 2//metal stacks

Narayanan, V., Maitra, K., Linder, B.P., Paruchuri, V.K., Gusev, E.P., Jamison, P., Frank, M.M., Steen, M.L., La Tulipe, D., Arnold, J., Carruthers, R., Lacey, D.L., Cartier, E.

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 152 KB

english, 2006

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